Abstract: In response to the issue of poor detection performance on wafer surface defect spots and elongated scratches, an improved RT-DETR method for wafer surface defect detection is proposed.
Abstract: Recent contrastive multimodal vision-language models like CLIP have demonstrated robust open-world semantic understanding, becoming the standard image backbones for vision-language ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback