Scanning probe lithography (SPL) represents a rapidly evolving class of nanofabrication techniques that utilise the precision of scanning probe microscopy to directly manipulate material surfaces at ...

A new technical paper titled “Gradient Electronic Landscapes in van der Waals Heterostructures” was published by researchers ...

Scanning probe block copolymer lithography (SPBCL), in combination with density-functional theory (DFT), has been used to design and synthesize hydrogen evolution catalysts. DFT was used to calculate ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

(Nanowerk Spotlight) Nanotechnology device fabrication – from electronics to photonics, security, biotechnology and medicine – often requires some form of nanopatterning technique in order to achieve ...

At the recent SPIE Advanced Lithography conference, Imec, Infinitesima and others described a new metrology tool technology called a Rapid Probe Microscope (RPM). Infinitesima has shipped its first ...

A research team from Xi’an Jiaotong University, led by Xuesong Mei and Jianlei Cui, has made major strides in the field of nanotechnology, according to a recent study published in Engineering.