A new technical paper titled “Exploring Active Learning for Semiconductor Defect Segmentation” was published by researchers at Agency for Science, Technology and Research (A*STAR) in Singapore. “We ...

This new technical paper titled “End-to-end deep learning framework for printed circuit board manufacturing defect classification” is from researchers at École de technologie supérieure (ÉTS) in ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

Researchers have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long-standing ...

Within the meticulous and layered journey of manufacturing semiconductor wafers, which could encapsulate anywhere from hundreds to thousands of steps over one to two months, even a minor defect or ...

Cold soldering defects in a PV module. The problem has now become the most commonly found defect in pre-shipping module inspections. Image: CEA The electric grid is complex. For many generation ...

Researchers in quantum mechanics believe they’ve found a standard way to assess the viability of quantum memory in silicon chips — meaning existing components can be used as the fabric for a future ...

Nearly 8 percent of lithium-ion batteries from questionable low-cost brands could have dangerous manufacturing defects. Nearly 8 percent of lithium-ion batteries from questionable low-cost brands ...

What is the Market Size of Wafer Defect Inspection System? BANGALORE, India, Dec. 16, 2025 /PRNewswire/ -- In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth ...