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New approach allows insertion, real-time monitoring of quantum defects in diamonds

A novel fabrication approach developed by collaborating scientists at some of the top universities in the UK now allows for the insertion and real-time monitoring of quantum defects in diamonds. This ...
Semiconductor Engineering

Modulated Electron Microscopy Applied In The Process Monitoring Of Memory Cell And The Defect Inspection Of Floating Circuits

A technical paper titled “In situ electrical property quantification of memory devices by modulated electron microscopy” was published by researchers at Hitachi High-Tech Corporation, KIOXIA ...
Seeking Alpha

WiMi Developed Digital Holography-Based Semiconductor Wafer Defect Detection Technology

BEIJING, Aug. 31, 2023 /PRNewswire/ -- WiMi Hologram Cloud Inc. (WIMI) ("WiMi" or the "Company"), a leading global Hologram Augmented Reality ("AR") Technology provider, today announced that an ...
EurekAlert!

Ensuring flawless metal 3D printing: New research tackles high-fidelity, high-resolution process monitoring

Researchers from Northwestern University, University of Virginia, Carnegie Mellon University, and Argonne National Laboratory have made a significant advancement in defect detection and process ...
AZOM

Boost Production Quality by Monitoring Key Parameters in Battery Electrode Processes

The growing demand for Lithium-ion (Li-ion) batteries, driven by applications such as electric vehicles and long-duration energy storage, has increased the pressure on battery manufacturers to enhance ...